TOF-SIMS depth profiling data of a transfected HEK cell

Kraft, Mary L.; Fisher, Gregory L.; Chini, Corryn E.; Gorman, Brittney L.; Brunet, Melanie A.

doi:10.13012/B2IDB-5513643_V1

TOF-SIMS depth profiling data of a transfected HEK cell

Cite this dataset:

Kraft, Mary L.; Fisher, Gregory L.; Chini, Corryn E.; Gorman, Brittney L.; Brunet, Melanie A. (2025): TOF-SIMS depth profiling data of a transfected HEK cell. University of Illinois Urbana-Champaign. https://doi.org/10.13012/B2IDB-5513643_V1

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Metadata


Dataset Description	This dataset consists of the time-of-flight secondary ion mass spectrometry (TOF-SIMS) depth profiling data that was collected with a PHI nanoTOF II Parallel Imaging MS/MS instrument from a 70 micron by 70 micron region on a recombinant HEK cell labeled with a stain that accumulates in the endoplasmic reticulum (ER-Tracker Blue White DPX, Invitrogen).
Keywords	TOF-SIMS; secondary ion mass spectrometry; depth profiling; endoplasmic reticulum; fluorine; total ion count; TIC image; ion image, tandem mass spectrometry imaging, ER-tracker
License	CC BY
Funder	U.S. National Institutes of Health (NIH)-Grant:R01GM109888
Funder	U.S. National Science Foundation (NSF)-Grant:CHE-1508662
Funder	Physical Electronics, Inc.
Corresponding Creator	Mary L. Kraft
Downloaded	205 times
Related Materials (2) Article C. E. Chini, G. L. Fisher, B. Johnson, M. M. Tamkun, M. L. Kraft, "Observation of endoplasmic reticulum tubules via TOF-SIMS tandem mass spectrometry imaging of transfected cells." Biointerphases 2018, 13 (3), 03B409. https://doi.org/10.1116/1.5019736. Thesis C. E. Chini, "Mass spectrometry methods for imaging cellular lipids, organelles, and proteins." Ph.D. thesis, 2019, University of Illinois at Urbana-Champaign. https://hdl.handle.net/2142/105924